Path: utzoo!attcan!uunet!lll-winken!lll-lcc!lll-tis!ames!ncar!gatech!udel!burdvax!bigburd.PRC.Unisys.COM!judy
From: judy@bigburd.PRC.Unisys.COM (Judy P. Clark)
Newsgroups: comp.ai
Subject: Machine Design for Testability References
Message-ID: <6316@burdvax.PRC.Unisys.COM>
Date: 12 May 88 15:49:58 GMT
Sender: news@PRC.Unisys.COM
Lines: 18

Several weeks ago someone asked for references on the application of 
AI techniques to testability in VLSI design.  I only saw one response to
that request and would be interested in receiving a summary if there were
more.

However, what I am more interested in is information on design for
testability of entire machines or systems.  Does anyone know of any
references?

Thanks in advance,

Judy Clark
judy@prc.unisys.com


Judy Clark                judy@prc.unisys.com
Unisys Defense Systems
PO Box 517
Paoli, PA 19301