Path: utzoo!attcan!uunet!lll-winken!lll-lcc!lll-tis!ames!ncar!gatech!udel!burdvax!bigburd.PRC.Unisys.COM!judy From: judy@bigburd.PRC.Unisys.COM (Judy P. Clark) Newsgroups: comp.ai Subject: Machine Design for Testability References Message-ID: <6316@burdvax.PRC.Unisys.COM> Date: 12 May 88 15:49:58 GMT Sender: news@PRC.Unisys.COM Lines: 18 Several weeks ago someone asked for references on the application of AI techniques to testability in VLSI design. I only saw one response to that request and would be interested in receiving a summary if there were more. However, what I am more interested in is information on design for testability of entire machines or systems. Does anyone know of any references? Thanks in advance, Judy Clark judy@prc.unisys.com Judy Clark judy@prc.unisys.com Unisys Defense Systems PO Box 517 Paoli, PA 19301